United States

IEEE WiPDA 2021

Vertical GaN


**[DOWNLOAD THE DRC 2021 DIGEST](https://drive.google.com/file/d/17_-pkYf4IBbVuNYgohTf0iZJORVGp_uN/view?usp=sharing)**

**[DOWNLOAD A COPY OF THE FINAL DRC PROGRAM](https://drive.google.com/file/d/1Ek8UIDCowpLq0z2hXav5tn67FboxS03N/view?usp=sharing)**

For almost eight decades, the Device Research Conference (DRC) has brought together leading scientists, researchers and students to share their latest discoveries in device science, technology and modeling. Notably, many of the first public disclosures of key device technologies were made at the DRC. This year marks the 79th anniversary of the DRC—the longest running device research meeting in the world. As we commemorate this meeting, the high-caliber technical sessions will be highlighted by plenary talks and invited talks by international research pioneers and leaders behind modern electronic technology.

Given the ongoing global health concerns associated with COVID-19 (Coronavirus), the DRC leadership has decided to hold the 2021 Device Research Conference in a virtual (online) format. This follows an enormously successful 2020 DRC held virtually, in which we had record attendance and worldwide participation of more than 875 attendees from 33 countries.

The 2021 Conference will feature:

* Informative, timely short courses in rapidly developing fields
* Oral and poster presentations on electronic/photonic device experiments and simulations
* Plenary and invited presentations given by worldwide leaders
* Evening “rump” session
* Strong student participation and Student Paper Awards

DRC is held in coordination with the Electronic Materials Conference (EMC), which will occur the same week, from June 23-25. As has happened in person in past years, in 2021, the virtual DRC and EMC sessions on the shared day, Wednesday, June 23, will be open to all attendees from both conferences. This recognizes the strong interaction between device and electronic materials research and provides fruitful exchanges of information between attendees of both Conferences. For information on the 63rd Electronic Materials Conference, please visit the [EMC 2021 website.](https://www.mrs.org/63rd-emc/)

2021 DRC individual presentation videos will become available in Underline at the end of each technical session. A recording of each full live session with Q&A will be posted later during the conference. To facilitate re-viewing of recorded talks and sessions, the DRC Underline site will remain open through 11:59pm (US EDT) on July 7th. DRC Conference registration will remain open at www.mrs.org/drc-2021/registration through June 30th.

Thank you for joining us at the 2021 Device Research Conference!

**General Chair**
<br>Zhihong Chen, Purdue University

**Technical Program Chair**
<br>Becky (R.L.) Peterson, University of Michigan

**Technical Program Vice-Chair**
<br>Gregg Jessen, BAE Systems

You can register for the 79th Device Research Conference with the following link. https://www.mrs.org/drc-2021

DRC 2021

For almost eight decades, the Device Research Conference (DRC) has brought together leading scientists, researchers and students to share their latest discoveries in device science, technology and modeling. Notably, many of the first public disclosures of key device technologies were made at the DRC. This year marks the 79th anniversary of the DRC—the longest running device research meeting in the world. As we commemorate this meeting, the high-caliber technical sessions will be highlighted by plenary talks and invited talks by international research pioneers and leaders behind modern electronic technology.

tutorial

The IEEE Workshop on Wide Bandgap Power Devices & Applications (WiPDA) provides a forum for device scientists, circuit designers, & application engineers from the Power Electronics & Electron Devices Societies to share technology updates, research findings, experience & potential applications.

**Topics of interest**

* Heteroepitaxial & Bulk Materials Growth
* Gate Dielectrics & Surface Passivation
* Device Structures & Fabrication Techniques
* Device Characterization & Modeling
* Very-High Efficiency or Compact Converters
* Safe Operating Areas of Wide Bandgap Devices, Including Short Circuit, Spike, & Transient Tolerance
* Harsh Environment (High Temperature) Operation & Reliability
* Packaging Power Modules & ICs
* Hard-Switched & Soft-Switched Application Analysis
* Gate Drive & Other Auxiliary Circuits
* High-Performance Passive Components
* Applications in Renewable Energy & Energy Storage, Transportation, Industrial Drives, & Grid Power Systems
* Wide Band Gap System Design Philosophies & Strategies
* Radio Frequency (RF) GaN (New)
* Technology Roadmap of Wide Bandgap Including Devices, Applications and Packaging (New)

### Please select the button below to view and download the session papers. The Virtual Proceedings PDF can be downloaded [here.](https://drive.google.com/file/d/171y2_u63V-pc9-bC-eZgHLzJou2oCfST/view?usp=sharing)

[![](https://assets.underline.io/uploads/markdown_image/1/image/c8e1b0a2881d3bb0a75ece4761f43c9f.png)](https://drive.google.com/drive/folders/1GWEFLzH6K4aUBaJiBFJDw4x9sKLTl6-g?usp=sharing)


This event requires a registration to attend, please register [here](https://web.cvent.com/event/536cea3d-4c0d-4d50-8939-529979d80785/summary) to purchase a ticket. 

The IEEE Workshop on Wide Bandgap Power Devices & Applications (WiPDA) provides a forum for device scientists, circuit designers, & application engineers from the Power Electronics & Electron Devices Societies to share technology updates, research findings, experience & potential applications.

In this paper, a comprehensive comparative analysis is performed on the short circuit (SC) withstand time and failure modes between a 650 V SiC Planar MOSFET, a 650 V SiC Trench MOSFET and a 650 V SiC Cascode JFET. The short circuit tests have been performed at a DC link voltage of 400 V with gate turn-OFF voltages at 0 V and -5 V. The results show that the SiC Cascode JFET failed in a source-to-drain short circuit with the gate still capable of blocking voltage while the SiC Planar and Trench MOSFETs failed with the Gate-Source (VGS) terminal short circuited and Drain-Source (VDS) terminals still capable of blocking voltage. Furthermore, short circuit withstand times measured on the SiC Planar and Trench MOSFETs showed an increase (20% for the Planar MOSFET and 9% for the Trench MOSFET) when the device gate voltages were turned-OFF with -5V compared to 0V. This was due to the increased inductance of the negative voltage gate driver reducing the peak short circuit current. In the case of the SiC Cascode JFET, there was no dependence of the short-circuit withstand time on the VGS turn-OFF voltage.

Comparison of Short Circuit Failure Modes in SiC Planar MOSFETs, SiC Trench MOSFETs and SiC Cascode JFETs

A low conduction resistance 1200 V/ 4 mΩ SiC power module is fabricated and characterized for its thermal performance. The design and fabrication of the power module is presented. The parasitic resistance distribution from the module prototype is measured and shows that it is critical to minimize the source bond wire and contact resistance for such low on-state resistance module. The steady-state thermal tests are performed, and the temperature distribution of the fabricated module is measured and validated. A FEA model of the SiC module is built and validated by the steady-state thermal tests. Then the transient thermal performance or surge current capacity is studied. It shows that at least 4 bond wires are required for each SiC die such that the module package will not limit the surge current capacity of SiC chips.

Development and Thermal Characterization of a Low Resistance SiC Module

A double-side cooled 10 kV, 25 A SiC MOSFET package is proposed which utilizes a wirebond-less molybdenum interconnect to alleviate thermomechanical stress and improve reliability. An effective junction-to-case thermal resistance of 0.17 ºC/W is achieved, enabling the package to dissipate a heat flux at the MOSFET surface in excess of 200 W/cm^2 with less than 30ºC temperature rise from the device junction to the package exterior. Thermal and thermomechanical finite element simulations were carried out to select materials and manufacturing processes that ensure manageable thermomechanical stress levels are maintained during fabrication and operation. Simulations were verified with experimental results and the package successfully demonstrated 150ºC continuous operation without degradation.

Thermal and Thermomechanical Analysis of a 10 kV SiC MOSFET Package with Double-Sided Cooling

This presentation reports the experimental results of the fabricated 4H-SiC Lateral Junction Field Effect Transistor (LJFET) and cell-to-cell integrated Lateral Bi-directional JFET (LBiDJFET). It was found that the reverse conduction characteristics of SiC LJFET were better than the forward conduction characteristics in terms of on-state resistance. The conduction mechanism of LBiDJFET can be described by the series connection of the forward and reverse conduction of LJFETs. This intriguing behavior of the cell-to-cell integration approach is promising because it can greatly reduce the wafer area consumed while achieving the bi-directional functions.

Demonstration of Cell-to-Cell Integrated 4H-SiC Lateral Bi-Directional Junction Field Effect Transistor (LBiDJFET)

GaNFast™ power ICs, use next-generation gallium nitride (GaN) to replace legacy silicon chips to enable up to 3x faster charging and 3x more power in half the size and weight for mobile fast chargers, consumer electronics, solar, data centers and EVs, replacing silicon in a market worth over $13B by 2026. Now, a next-generation enables even higher efficiency, autonomy and reliability with precision sensing of system current, voltage and temperature and real-time control and protection. External monitoring components – such as large, lossy sense resistors – are eliminated, reducing system power loss, reducing complexity and reducing cost. This new GaNFast generation is a core element as we “Electrify Our World™” and accelerate the conversion away from fossil fuel sources and loads. As well as enabling efficiency improvements that reduce the carbon emissions of target applications, small die-size, fewer manufacturing process steps and integrated functionality mean that GaNFast power ICs have up to 10x lower CO2 footprint than silicon-based solutions, and save 4 kg CO2 per IC shipped, vs. equivalent legacy silicon chips.

Advances in GaN Power ICs: Efficiency, Reliability & Autonomy

SiC semiconductor technology has enjoyed rapid market adoption in the last few years. SiC MOSFETs have been adopted in a variety of markets such as solar inverters, industrial power supplies, and EV onboard and off-board chargers. But the rapid adoption of SiC for the drive train inverters in Battery Electric Vehicles is changing the market landscape for SiC. It is being adopted in these inverters because it offers a 5-10% improvement in efficiency, which results in either extended range for the vehicle for a given battery charge, or a reduction in the battery pack required to go a certain distance. A large number of automotive OEMs now have SiC targeted for incorporation into their EV drives. SiC power device manufacturing is based now on 150 mm substrates, allowing cost reduction over recent years. As the market grows further, the push to 200 mm substrates is inevitable, and Cree | Wolfspeed’s new wafer fab will be the first to start production on 200 mm.

SiC MOSFETs and the Drive for Electric Vehicles

With unrivalled better technology-specific figure-of-merits SiC MOSFETs and GaN HEMTs have started to conquer high power applications such as Mobile phone chargers, On-board chargers and Motor drives replacing IGBTs or Superjunction devices. Driven by ever higher demands on power density and efficiency and new trends such as bidirectional power flow for vehicle-to-x applications, wide bandgap power devices have turned into a focal point of design activities. In all of these applications a simple replacement of IGBTs or Superjunction devices by wide bandgap devices may bring already some benefits. The full potential of wide bandgap devices, however, will only be reached when being combined with perfectly matching topologies and control. In motor drives e.g. replacing the IGBTs of a B6 bridge with SiC MOSFETs may result in better efficiency in light load and urban drive cycles. However, switching speed limitations down to around 5V/ns to avoid e.g. partial discharge in the insulation of the motor windings or reflections in long cables, will prevent to increase switching frequencies substantially. In contrast, changing the topology from a voltage source inverter to a current source inverter, which creates a continuous voltage on the machine, opens up a completely new optimization range both for the electric machine and its inverter. Similarly, a transition from modular single phase power stages into true 3-phase active frontends using synergetic control options enables much higher power density for on-board chargers. The presentation will start with a few key characteristics of the involved technologies and their perspective and will highlight system advantages of wide bandgap power devices in a few selected key applications such as Onboard chargers and Motor drive.

On the benefits of SiC and GaN in high power applications

Integrated circuits made using GaN-on-Si substrates have been in production for over seven years. During that time, GaN-based ICs have evolved from pure discrete devices to monolithic half-bridge devices and then onto power FETs that included their own monolithically integrated driver, and more recently, to fully monolithic power stages including power FETs, drivers, level shifting circuits, logic, and protection. In this talk we will look at the roadmap of GaN-on-Si integration and show how the role of discrete transistors is destined to diminish to near-zero in the next few years.

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Comparison of Short Circuit Failure Modes in SiC Planar MOSFETs, SiC Trench MOSFETs and SiC Cascode JFETs

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